NWSPEC

SR30 Spectrometer for wafer testing

Name: SR30 Spectrometer for wafer testing
Brand: NWSPEC
Price: 1350.00 USD
Availability: InStock

SR30: High-Speed Spectrometer for Industrial Applications

Designed and developed specifically for industrial application customers. The SR30 delivers high-speed spectral output, high-speed sampling, and high-speed transmission with a stable structure and low drift characteristics that support large-scale industrial customized OEM applications.

Supporting cross-platform secondary development packages (SDK), customers can complete rapid development and application by using the provided function libraries. Ideal for wafer inspection, optical spectroscopy inspection, online high-speed spectroscopy inspection, film transmittance inspection, industrial integration inspection, and teaching and research applications.

Product Highlights

High-Speed Performance: Up to 10 MHz chromatogram output, 0.8 ms per frame sampling
High Sensitivity: 2600 V/(lx·s) with 1024 pixel Hamamatsu CMOS sensor
UV Response: 200 - 1100 nm spectral range with high-order diffraction suppression
Low Drift: Stable structure with automatic zeroing function for industrial reliability
Cost-Effective: High performance OEM solution for large-scale industrial deployment

Applications

Industrial Inspection

Wafer inspection for semiconductor quality control
Optical spectroscopy inspection for precision manufacturing
Online high-speed spectroscopy inspection for real-time monitoring
Film transmittance inspection for coating quality verification
Industrial integration inspection for automated production lines

Research & Development

Teaching and research applications in academic institutions
Cross-platform development with Windows, Android, Linux, Wince support
Rapid application development using provided SDK function libraries

Key Features

Performance

High sensitivity for precise spectral measurements
High-speed chromatogram output: up to 10 MHz for rapid data acquisition
Ultraviolet response: 200 - 1100 nm broad spectral coverage
High-speed sampling: up to 0.8 ms per frame for real-time applications
Low stray light: <0.1% for accurate measurements

Reliability

Low drift characteristic ensures long-term stability
Automatic zeroing function for maintenance-free operation
Stable structure designed for industrial environments
High cost-effectiveness for OEM large-scale deployment

Optical Resolution

Wavelength Range	Wavelength Resolution (nm)	30 μm slit	40 μm slit	50 μm slit	60 μm slit	70 μm slit	100 μm slit	150 μm slit	200 μm slit
200-500 nm	0.32	0.80	1.00	1.10	1.20	1.40	2.10	3.00	4.00
350-950 nm	0.66	1.20	2.00	2.20	2.40	2.80	3.80	5.80	7.70
600-1100 nm	0.64	1.20	2.00	2.20	2.40	2.80	3.80	5.80	7.70

Technical Specifications

Spectral Specifications
Spectral Range	200-1100 nm
Spectral Resolution	Maximum 0.32 nm
Optical Resolution	Maximum 0.8 nm FWHM
Higher-Order Diffraction	Add a high-order diffraction suppression filter
Stray Light	<0.1%

Detector Specifications
Detector Model	Hamamatsu CMOS linear array sensor
Spectral Detection Range	200-1100 nm
Pixel	1024 pixels
Pixel Size	25 × 500 μm
High Sensitivity	2600 V/(lx·s)
Fastest Speed	10 MHz

Optical Specifications
Optical Path	F/4, symmetrical cross Czerny-Turner optical path
Focal Length	70 mm; 90 mm
Incident Slit	Standard 70 μm (optional)
Optical Fiber	SMA905 0.22 NA

Electrical Specifications
Signal-to-Noise Ratio	500:1
Linearity	>99.8%
Integration Time	0.1 ms - 1 s
Dynamic Range	150,000
AD Converter	No distortion 16-bit
Test Speed	1.8 ms + integration time
Communication Interface	USB 2.0, RS232, RS485
Power Consumption	300 mA @ 5V DC
Cooling	16-pin expansion interface with external trigger function

Physical Specifications
Dimensions	128 × 72 × 40 mm (5.0 × 2.8 × 1.6 inches)
Weight	500 g (1.1 lb)
Mounting	3-direction standard installation holes
Operating Systems	Windows, Android, Linux, Wince