NWSPEC
LED Test System for Chip & Lamp Characterization
LED Test System for Chip & Lamp Characterization
Couldn't load pickup availability
LED Test System
Complete LED characterization in milliseconds. Integrated photometric, colorimetric, and electrical testing for LED chips and finished lamps—from R&D validation to production line quality control.
Combines high-precision spectrophotometer, program-controlled power supply, and integrating sphere in one coordinated system. Measure luminous flux, color temperature, CRI, and electrical parameters simultaneously with production-speed throughput.
Why Choose the 7000 Series
- True Integration: Spectrometer, power supply, and integrating sphere operate as unified system—no cable routing, synchronization issues, or calibration mismatches
- Millisecond Throughput: 2.8 ms test speed + integration time enables 100% production line testing without bottlenecks
- Wide Dynamic Range: Single system covers 1 lm to 20,000 lm with 0.5% linearity—no range switching or multiple instruments
- Precision Colorimetry: ±0.0003 chromaticity accuracy and ±10K CCT precision for tight LED binning and quality standards
- Complete Electrical Test: Programmable 0.3 µA–2A current source with VF, IF, IR, VR parameter measurement
System Components
Spectro-Analyzer
High-precision rapid spectrophotometer with 350–950 nm range, 0.1 nm resolution, and millisecond acquisition. Delivers photometric, colorimetric, and radiometric parameters in single measurement.
2030 Power Supply
Programmable constant voltage/current source with 0–60V, 0.3 µA–2A output. Automated LED driving with precise current control for IV curve characterization and production testing.
0.3m Integrating Sphere
Compact sphere for luminous flux collection with multiple port configurations. Compatible with various LED packages and adjustable for different emission patterns.
Application Solutions
LED Chip Inspection
Wafer-level and packaged chip testing for binning, quality sorting, and forward voltage characterization. Rapid throughput for high-volume LED manufacturing.
Finished Light Source QC
Final inspection of LED lamps, bulbs, and modules. Verify luminous flux, color consistency, CRI, and electrical safety before shipment.
Flash Lamp Testing
Characterize xenon and LED flash sources for cameras, mobile devices, and automotive applications. Millisecond timing captures pulse parameters accurately.
Medical Endoscope Light Sources
Precision measurement for surgical and diagnostic illumination systems. Verify color rendering for tissue differentiation and output stability for procedure safety.
Compatible LED Types
Technical Advantages
Spectral Performance
- 350–950 nm spectral range — Covers visible and near-UV for white LED and phosphor characterization
- 0.1 nm wavelength resolution — Precise peak wavelength identification for binning and spectral analysis
- High sensitivity, low stray light — Accurate measurement of weak emissions and narrow-band sources
- 0.5% linearity — Consistent accuracy across 4+ decades of luminous flux
Colorimetric Precision
- ±0.0003 chromaticity accuracy — Standard A source traceable precision for demanding binning
- ±0.0002 repeatability — Stable results for blue LED testing and tight tolerance production
- 100K–100,000K CCT range — From infrared to deep UV-white sources
- ±10K CCT accuracy — Precise color temperature for white LED sorting
- 0–100 CRI with ±0.3% error — Complete color rendering assessment
Electrical Test Capability
- 0.3 µA–400 mA @ 60V — Low-current precision for small signal LEDs
- 400 mA–2.0 A @ 20V — High-current drive for power LEDs and arrays
- 0–60V voltage output — Covers high-voltage LED series configurations
- Complete IV characterization — POL, VF, IF, VFL, IR, VR parameters
- Programmable sequencing — Automated test routines with set delay + 1.5 ms per device
Integration & Control
- USB 2.0 and RS232 interfaces — Flexible PC connectivity and automation integration
- General circuit board compatibility — Easy integration with handlers, probers, and production equipment
- SOT3, EOT3, PIN10 I/O — Standard semiconductor test interfaces
- Rapid data processing — Real-time calculation and output for production feedback
Technical Specifications
| Parameter | Specification |
|---|---|
| Spectral Characteristics | |
| Spectral Range | 350–950 nm |
| Wavelength Resolution | 0.1 nm |
| Colorimetric Characteristics | |
| Chromaticity Coordinate Accuracy | ±0.0003 (standard A light source) |
| Chromaticity Repeatability | ±0.0002x, ±0.0002y (blue LED test) |
| Luminous Flux Range | 1 lm – 20,000 lm (with different integrating spheres) |
| Linearity | 0.5% |
| Luminance Repeatability | 0.2% |
| CCT Range | 100 K – 100,000 K |
| CCT Accuracy | ±10 K (standard A light source) |
| CRI Range | 0 – 100.0 |
| CRI Error | ±0.3% + 0.5 |
| Color Tolerance Accuracy | ±1.0 |
| Test Speed | 2.8 ms + integration time |
| Electrical Parameters | |
| Test Parameters | POL, VF, IF, VFL, IR, VR |
| Applicable Lamp Types | Two-pin single lamp |
| Current Output Range | 0.3 µA – 400 mA @ 60V; 400 mA – 2.0 A @ 20V |
| Voltage Output Range | 0 – 60 V |
| I/O Quantity | SOT3; EOT3; PIN10 |
| Test Speed (Electrical) | (Set delay + 1.5 ms) × number of devices |
| Communication Interface | USB 2.0, RS232 (general circuit board compatible) |
| Power Supply | AC 220V / 3A |
Accelerate Your LED Production
Contact our applications engineers to discuss integration with your production line or handler system.
