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NWSPEC

LS Series Spectrophotometer | UV Vis NIR 165–3600 nm | NWSPEC

LS Series Spectrophotometer | UV Vis NIR 165–3600 nm | NWSPEC

LS Series UV-Vis-NIR Spectrophotometers

Precision without boundaries. Performance without compromise.

The LS Series delivers research-grade optical characterization across five distinct performance tiers. From vacuum UV specialist instruments to ultra-broadband NIR systems, each model is engineered for specific analytical demands. Choose S-Series models for cost-effective, reliable performance, or D-Series models for ultimate precision with two-stage holographic grating technology.

All LS Series instruments share core advantages: double-beam ratio recording photometry for exceptional stability, socket-type lamps for maintenance-free operation, and intelligent automatic switching between sources and detectors. The difference lies in optical sophistication—single holographic gratings for standard applications, two-stage gratings for demanding research.

Series-Wide Advantages

  • Double-Beam Architecture: Dynamic feedback ratio recording ensures baseline stability and compensates for source fluctuations
  • Automatic Switching: Source and detector crossover points user-configurable with 0.05 nm precision
  • Maintenance-Free Design: Socket-type lamp holders enable tool-free replacement without optical realignment
  • Flexible Sampling: Compatible with full range of integrating spheres and reflectance accessories

Technical Specifications

LS-UV — Vacuum UV Specialist (165–320 nm) LS-2800S S — Standard, 190–2800 nm LS-3600S S — Standard, 190–3600 nm LS-2800D D — Performance, 190–2800 nm LS-3600D D — Research, 190–3600 nm
Parameter LS-UV LS-2800S LS-3600S LS-2800D LS-3600D
Grating System Two-stage holographic UV Single holographic Single holographic Two-stage holographic Two-stage holographic
Wavelength Range 165–320 nm (190–1100 nm) 190–2800 nm 190–3600 nm 190–2800 nm 190–3600 nm
Detectors PMT PMT + PbS (cooled) PMT + PbS (cooled) PMT + PbS (cooled) PMT + InGaAs + PbS (cooled)
Wavelength Accuracy UV-Vis / NIR ±0.3 nm ±0.5 / ±2.0 nm ±0.5 / ±2.0 nm ±0.3 / ±1.0 nm ±0.1 / ±0.5 nm
Wavelength Repeatability UV-Vis / NIR ≤±0.1 nm ≤±0.1 / ≤±0.35 nm ≤±0.1 / ≤±0.35 nm ≤±0.1 / ≤±0.35 nm ≤±0.05 / ≤±0.1 nm
Stray Light (220 nm, NaI) ≤0.0005% ≤0.005% ≤0.005% ≤0.0005% ≤0.0002%
Stray Light (340 nm, NaNO₂) ≤0.0005% ≤0.005% ≤0.005% ≤0.0005% ≤0.0001%
Stray Light (1420 nm, H₂O) ≤0.08% ≤0.08% ≤0.008% ≤0.001%
Photometric Range 5.0 Abs ±4.0 Abs ±4.0 Abs >±5.0 Abs ±6.0 Abs
Photometric Accuracy (0–0.5A / 0.5–1A) ±0.002 / ±0.004 ±0.004 / ±0.005 ±0.004 / ±0.005 ±0.002 / ±0.004 ±0.0018 / ±0.003
Photometric Repeatability (0–0.5A / 0.5–1A) ±0.001 / ±0.002 ±0.001 / ±0.002 ±0.001 / ±0.002 ±0.001 / ±0.002 ±0.0009 / ±0.0018
Baseline Flatness (300–2800 nm) ±0.02 Abs ±0.02 Abs ±0.006 Abs ±0.0003 Abs
Baseline Drift (500 nm, 2h) 0.0004 Abs/h 0.0005 Abs/h 0.0005 Abs/h 0.0004 Abs/h 0.0003 Abs/h
Noise (500 nm / 1600 nm) ≤0.0008 Abs (400 nm) ≤0.008 / ≤0.009 ≤0.008 / ≤0.009 ≤0.0008 / ≤0.0009 ≤0.0006 / ≤0.0004
Spectral Bandwidth UV-Vis: 0.1/0.2/0.5/1/2/3/5/8 nm (8 settings) | NIR: 0.2/0.5/1/2/3/5/8/12/20/32 nm (10 settings)
Sampling Interval 0.01–50 nm (programmable)
Light Source Deuterium lamp (UV) + Halogen tungsten lamp (50W, Vis-NIR)
Source/Detector Switching Automatic (250–400 nm source, 300–5500 nm detector, 0.05 nm step)

Model Selection Guide

LS-UV: Vacuum UV Specialist

The only LS Series model capable of reaching 165 nm in the vacuum UV. Two-stage holographic grating optimized for deep UV performance with exceptional stray light rejection (0.0005%). Essential for semiconductor materials analysis, high-purity gas characterization, and vacuum UV optical component testing. Can be configured for standard UV-Vis (190–1100 nm) operation.

LS-2800S: Standard NIR Performance

Cost-effective solution for routine analysis from 190–2800 nm. Single holographic grating with PMT and cooled PbS detectors delivers reliable performance for teaching laboratories, quality control, and industrial applications where ultimate precision is not required. The economical entry point to NIR spectroscopy.

LS-3600S: Extended Range Standard

Extends NIR coverage to 3600 nm while maintaining the cost advantages of single-grating architecture. Ideal for polymer characterization, chemical analysis, and applications requiring C-H overtone information without the premium of D-Series optics.

LS-2800D: High Performance

Two-stage holographic grating technology delivers 10× better stray light than S-Series (0.0005% vs 0.005%). The >±5.0 Abs photometric range handles high-absorbance samples such as optical coatings, safety glass, and concentrated solutions. Improved wavelength accuracy (±0.3 nm UV, ±1.0 nm NIR) for demanding industrial QC.

LS-3600D: Research Grade

The ultimate LS Series performance. Two-stage grating plus InGaAs detector optimization achieves 0.0001% stray light—50× better than S-Series. Wavelength accuracy of ±0.1 nm (UV) and ±0.5 nm (NIR), baseline flatness of ±0.0003 Abs, and noise as low as 0.0004 Abs at 1600 nm. For R&D, publication-quality data, and regulatory compliance where only the best will suffice.

S-Series vs D-Series: Key Differences

Feature S-Series (Standard) D-Series (Performance)
Grating Architecture Single holographic Two-stage holographic
Stray Light Performance 0.005% (10× higher) 0.0005% – 0.0001% (ultra-low)
Wavelength Accuracy (UV) ±0.5 nm ±0.3 nm – ±0.1 nm
Baseline Flatness ±0.02 Abs ±0.006 – ±0.0003 Abs (66× better)
NIR Detector Options PbS only PbS or InGaAs + PbS (3600D)
Best For Routine analysis, teaching, QC Research, high-absorbance, compliance

Applications by Model

Optical Coatings & Thin Films

Recommended: LS-2800D or LS-3600D

High-absorbance coatings require D-Series stray light performance. Characterize anti-reflective, high-reflective, and beam-splitter coatings with absolute confidence.

Energy-Efficient Glass Certification

Recommended: LS-3600S or LS-3600D

Solar transmittance and thermal insulation measurements benefit from extended NIR coverage. D-Series recommended for compliance with stringent international standards.

Solar Energy Materials

Recommended: LS-3600D

Comprehensive spectral characterization from UV to 3600 nm with research-grade accuracy for photovoltaic and thermal solar optimization.

Polymer & Chemical Manufacturing

Recommended: LS-3600S (QC) or LS-3600D (R&D)

C-H, N-H, and O-H overtone analysis in the 2800–3600 nm region. S-Series for production control, D-Series for formulation development.

Semiconductor & Vacuum UV

Recommended: LS-UV

The only choice for vacuum UV characterization below 190 nm. Essential for next-generation lithography materials and high-purity gas analysis.

Teaching & Routine Analysis

Recommended: LS-2800S

Reliable performance at economical price point. Ideal for educational institutions and industrial QC labs with standard analytical requirements.

Sampling Accessories

Integrating Spheres

100 mm, 150 mm, and 270 mm diameter spheres with BaSO₄ or Spectralon coatings for diffuse reflectance and transmittance measurements. Essential for solar glass certification, colorimetry, and powder analysis.

Reflectance Accessories

5°, 8°, and 12° specular reflectance modules for optical coatings; variable angle (5–85°) for angle-resolved measurements; absolute reflectance (V-W method) for highest accuracy.

Transmission Holders

Universal cuvette holders, film holders, and solid sample mounts with temperature control options. Adjustable pathlength cells for liquid samples from 0.01–100 mm.

Specialized Options

Glan-Thompson polarizers (200–2500 nm) for anisotropic materials. Fiber optic couplers for remote sampling. Automated sample changers for high-throughput applications.

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Since 1993 30+ Years of Instrument Expertise
Reliable Manufacturer Manufacturing & Services
Ph.D. Founded Dr. Pingxin Wang, UT Austin
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Frequently Asked Questions

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Feel free to call us T+86 189-6516-4839
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