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NWSPEC

SR30 High-Speed Industrial Fiber Optic Spectrometer | OEM

SR30 High-Speed Industrial Fiber Optic Spectrometer | OEM

SR30 High-Speed Micro Optical Fiber Spectrometer

Application Order Guide

High-speed spectral acquisition for industrial, research, and OEM integration. Select components to match your throughput and precision requirements.

SR30 Key Advantages

Speed Integration time: 0.1ms. Test time: 1.9ms. Data output: 10MHz max.
Sensitivity 2600V (lx·s) — 2x higher than standard models. Ideal for low-light detection.
Stability Low temperature drift. Auto dark correction. Supports high-volume industrial OEM.
Platform Cross-platform SDK. Windows, Android, Linux, Wince support.
1
Select Application Type

Match your measurement need to the recommended system configuration

Wafer / Die Inspection
High-speed spectral measurement for semiconductor wafer and die quality control. Rapid throughput for production lines.
Speed: 1.9ms per spectrumApplications: Film thickness, defect detection, doping analysisRecommended: High-Res Spectrometer + Tungsten + Integrating Sphere
Spectral Detection / Analysis
General-purpose high-speed spectroscopy for research and analytical laboratories requiring fast data acquisition.
Speed: 10MHz data outputApplications: Kinetics, reaction monitoring, rapid screeningRecommended: UV-Vis Spectrometer + D2/W + Standard Fiber
High-Speed Online Detection
Real-time process monitoring for production lines. Continuous spectral feedback for automated quality control.
Speed: 0.8ms/frame minimumApplications: Coating lines, chemical processes, sorting systemsRecommended: UV-NIR Spectrometer + LED + Reflection Probe
Thin Film Transmission
Precise transmission measurement for optical films, filters, and coated substrates in R&D and production.
Wavelength: 200-1100nmApplications: AR coatings, display films, solar panelsRecommended: UV-NIR Spectrometer + D2/W + Transmission Fixture
Industrial Integration / OEM
Compact module for embedding into third-party instruments, automated test systems, and process control equipment.
Size: 128 x 72 x 40mmSDK: Cross-platform with full APIRecommended: Custom config + SDK + Auto-dark correction
Education / Research
Teaching and research platform for universities and institutes. Complete with standard solutions and cuvette accessories.
Includes: Standard solutions, cuvette holdersApplications: Teaching labs, research projects, method developmentRecommended: UV-Vis Spectrometer + D2/W + Cuvette Holder + Basic Software
2
Select Spectrometer Core

Detector type and wavelength range

Configuration Specifications Code Best For
UV-Vis (200-850nm) 1024-pixel CMOS linear sensor. Resolution ~0.8nm FWHM. Integration: 0.1ms-1000ms. SNR: 380:1. Dynamic range: 1200:1. UVV High-speed QC, online monitoring, education
UV-NIR (200-1100nm) 1024-pixel CMOS linear sensor. Resolution ~1.2nm FWHM. Extended NIR sensitivity. Integration: 0.1ms-1000ms. UVN Full-range analysis, thin film, wafer inspection
High Resolution (UV-Vis) 1024-pixel CMOS with enhanced pixel size (28 x 200μm). Resolution ~0.32nm. Maximum sensitivity: 2600V (lx·s). HRS Wafer inspection, precision research, low-light
Optical Platform Note All configurations use F/4 crossed Czerny-Turner optical path. Focal length options: 70mm or 90mm. Standard slit: 70μm (customizable). Fiber interface: SMA905, 0.22NA. Auto dark correction function included.
3
Select Light Source

Illumination matched to your wavelength range and application

Source Specifications Code Best For
Deuterium + Tungsten (D2/W) Full UV-Vis-NIR coverage: 200-1100nm. Output stability: ±0.5%. Combined broad-spectrum output for transmission/absorbance. D2W Transmission, absorbance, full-range analysis
LED Source (Visible) Stable visible output: 400-700nm. Lifetime: >50,000 hours. Low power consumption. Fast warm-up. LED Online detection, colorimetry, portable systems
Tungsten-Halogen (Vis-NIR) Economical visible to NIR: 350-2500nm. High output in NIR region. Stable thermal output for reflectance. THL Reflectance, wafer inspection, thin film
Xenon Source (Pulsed) High-intensity UV-Vis pulsed output. Ideal for fluorescence and time-resolved measurements with fast gating. XEN Fluorescence, flash photolysis, transient analysis
4
Select Fiber & Sampling Accessories

Probes, optics, and interfaces for your sample type

Standard Fiber Bundle
General-purpose fiber optic cable for standard laboratory and industrial setups.
Core diameter: 400μm, 600μm, or 1000μmLength: 1m, 2m, or customConnector: SMA905Code: FIB
Reflection / Back Scatter Probe
Y-type probe for diffuse reflectance and back scatter measurements on solid samples and coatings.
6-around-1 fiber configurationOptional focusing lens tipBest for: Powders, solids, wafers, filmsCode: RFP
Immersion / Dip Probe
Submersible probe for direct liquid transmission and online process monitoring in harsh environments.
Pathlength: 2mm, 5mm, or 10mmMaterial: Stainless steel / HastelloyBest for: Chemicals, water, process streamsCode: DIP
Integrating Sphere
Uniform light collection for total flux, diffuse reflectance, and color measurements on irregular samples.
Diameter: 38mm or 50mmCoating: PTFE (Spectralon equivalent)Best for: LED testing, wafer reflectance, colorCode: ISP
Optical Lens / Collimator
Focusing optics for free-space light collection, beam shaping, and remote sensing applications.
Focal lengths: Multiple options availableInterface: SMA905 or direct mountBest for: Beam analysis, remote measurementCode: LEN
Cuvette Holder
Standard cuvette holder for liquid absorption measurements in research and education labs.
Pathlength: 10mm standard cuvetteInterface: Fiber-coupledBest for: Liquid analysis, teaching labsCode: CUV
4-Way Cuvette Holder
Multi-position cuvette holder for parallel sample measurement and automated batch analysis.
Capacity: 4 cuvettes simultaneouslyInterface: Fiber-coupled with switchingBest for: High-throughput screening, QCCode: C4W
Optical Attenuator
Adjustable neutral density filter for controlling light intensity and preventing detector saturation.
Attenuation: Variable or fixed ND filtersMount: Standard optical mountBest for: High-intensity sources, sensitivity adjustmentCode: ATT
Standard White Plate / Reflector
Diffuse reflectance standard for calibration and baseline correction in reflectance measurements.
Material: PTFE-based diffuse reflectorReflectance: >95% across UV-Vis-NIRBest for: Reflectance calibration, color standardsCode: WPL
Underwater / Submersible Probe
Sealed probe assembly for underwater and harsh environment measurements.
Depth rating: CustomizableMaterial: Marine-grade housingBest for: Oceanography, water quality monitoringCode: UWP
5
Select Software Package

Control and analysis software level

Package Features Code Best For
Basic Control Real-time spectral display, high-speed data acquisition, basic math (smoothing, derivative), export to CSV/TXT/SPC. Auto-dark correction. BAS Standard laboratory use, teaching, online monitoring
Advanced Analysis Full chemometrics: PLS, PCA, MLR. Color analysis (CIE, CRI, CCT, CQS). Film thickness calculation. Custom method builder. Report generation. ADV QC labs, wafer inspection, thin film analysis
SDK / API Full hardware control API. Cross-platform: C++, C#, Python, LabVIEW. Example code and documentation included. OEM licensing. 16-pin extended port with external trigger. SDK System integrators, OEM partners, custom industrial apps
Operating System Support Software compatible with Windows, Android, Linux, and Wince. Communication interfaces: USB 2.0, RS232, RS485. Extended 16-pin port with external trigger capability. Auto dark correction function standard on all SR30 units.
6
Model Naming Reference

How to construct your complete order code

Position Component Available Codes
Base Platform SR30
1 Application Type WAF / SPD / OND / FIL / IND / EDU
2 Spectrometer UVV / UVN / HRS
3 Light Source D2W / LED / THL / XEN
4 Fiber / Accessory FIB / RFP / DIP / ISP / LEN / CUV / C4W / ATT / WPL / UWP
5 Software BAS / ADV / SDK
EXAMPLE CONFIGURATION
SR30-WAF-HRS-THL-ISP-ADV
Wafer inspection — High-Resolution spectrometer — Tungsten-Halogen source — Integrating Sphere — Advanced analysis software with film thickness module
EXAMPLE CONFIGURATION
SR30-OND-UVN-LED-RFP-SDK
High-speed online detection — UV-NIR spectrometer — LED source — Reflection Probe — SDK for OEM integration into production line
EXAMPLE CONFIGURATION
SR30-EDU-UVV-D2W-CUV-BAS
Education / Research — UV-Vis spectrometer — Deuterium/Tungsten source — Cuvette Holder — Basic control software
Lead Time Standard configurations: 2 weeks from order confirmation. Custom builds and OEM projects may require additional time — confirm with sales when ordering.
Customization & OEM Services Special wavelength ranges, resolution requirements, mechanical configurations, and private labeling are available upon request. Contact our technical team to discuss custom builds and OEM integration support.
Technical Support Not sure which configuration matches your application? Send your measurement requirements (sample type, wavelength range, speed requirements, environment) to our team for a recommended build.

Request a Quotation

Provide your configuration code or application requirements. Our team will confirm specifications, pricing, and lead time (typically 2 weeks) within 24 hours.

Contact Sales

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Since 1993 30+ Years of Instrument Expertise
Reliable Manufacturer Manufacturing & Services
Ph.D. Founded Dr. Pingxin Wang, UT Austin
Advantages Price · Service · Speed · Technical · Data
Fast Shipping In-Stock Orders Ship Same Day

Frequently Asked Questions

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Feel free to call us T+86 189-6516-4839
or email  sales@nwspec.com to:

• Place an order
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• Or if you have any other questions

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If you don't see the one you are looking for, please contact: sales@nwspec.com



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